Transport, magnetic and structural properties of (Tl/sub 0.5/Pb/sub 0.5/)Sr/sub 2-x/Ce/sub x/Ca/sub 2/Cu/sub 3/O/sub y/ compounds

June 6, 2017 | Autor: Mark Croft | Categoría: Engineering, Materials Engineering, Condensed Matter Physics, Materials Science, Quantum Physics, X ray absorption spectroscopy, Transmission Electron Microscopy, Transition-Metal Oxides, Pulsed Laser Deposition, Thin Film, Physical sciences, Magnetic Properties, Electrical Resistance, Temperature Dependence, CHEMICAL SCIENCES, Curie temperature, X ray diffraction, Single Crystal, Binding Energy, Structural Properties, Total Electron Yield, Low Temperature, Film Thickness, X ray Absorption, Electric Conductivity, Electrical And Electronic Engineering, Degree of Freedom, X ray absorption spectroscopy, Transmission Electron Microscopy, Transition-Metal Oxides, Pulsed Laser Deposition, Thin Film, Physical sciences, Magnetic Properties, Electrical Resistance, Temperature Dependence, CHEMICAL SCIENCES, Curie temperature, X ray diffraction, Single Crystal, Binding Energy, Structural Properties, Total Electron Yield, Low Temperature, Film Thickness, X ray Absorption, Electric Conductivity, Electrical And Electronic Engineering, Degree of Freedom

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